Subhechha, SubhaliSubhaliSubhechhaDegraeve, RobinRobinDegraeveRoussel, PhilippePhilippeRousselGoux, LudovicLudovicGouxClima, SergiuSergiuClimaDe Meyer, KristinKristinDe MeyerVan Houdt, JanJanVan HoudtKar, Gouri SankarGouri SankarKar2021-10-242021-10-2420170167-9317https://imec-publications.be/handle/20.500.12860/29518Modeling of uniform switching RRAM devices and impact of critical defectsJournal articlehttp://www.sciencedirect.com/science/article/pii/S0167931717301880