n-Channel bulk and DTMOS FinFETs: investigation of GIDL and gate leakage currents

Magan, Caio M.Caio M.MaganMartino, Joao A.Joao A.MartinoSimoen, EddyEddySimoenClaeys, CorCorClaeysde Andrade, Maria Gloria C.Maria Gloria C.de Andrade2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/26938n-Channel bulk and DTMOS FinFETs: investigation of GIDL and gate leakage currentsProceedings paperhttp://ieeexplore.ieee.org/document/7731350/