Ohyama, H.H.OhyamaHayama, K.K.HayamaTakakura, K.K.TakakuraMiura,MiuraShigaki, K.K.ShigakiJono, T.T.JonoSimoen, EddyEddySimoenPoyai, AmpornAmpornPoyaiClaeys, CorCorClaeys2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7937Irradiation temperature dependence of radiation damage in STI Si diodesJournal article