A fast procedure to accurately determine leaky modes in multilayered planar dielectric substrates

Rogier, HendrikHendrikRogierVande Ginste, DriesDriesVande Ginste2021-10-172021-10-1720080018-9480https://imec-publications.be/handle/20.500.12860/14384A fast procedure to accurately determine leaky modes in multilayered planar dielectric substratesJournal article