Kulkarni, S.R.S.R.KulkarniSchrimpf, R.D.R.D.SchrimpfGalloway, K.F.K.F.GallowayArora, R.R.AroraClaeys, CorCorClaeysSimoen, EddyEddySimoen2021-10-172021-10-1720090018-9499https://imec-publications.be/handle/20.500.12860/15630Total ionizing dose effects on Ge pMOSFETs with high-k gate stack: on/off current ratioJournal article