Impact of 60 MeV proton irradiations on the 4.2K characteristics of 0.7 µm cryo CMOS transistors

Claeys, CorCorClaeysSimoen, EddyEddySimoenMohammadzadeh, A.A.Mohammadzadeh2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3299Impact of 60 MeV proton irradiations on the 4.2K characteristics of 0.7 µm cryo CMOS transistorsMeeting abstract