Electro-optical characterization of modulation-doped field-effect transistors with monolithically-integrated test fixtures

Zeng, A.A.ZengJackson, M. K.M. K.JacksonVan Hove, MarleenMarleenVan HoveDe Raedt, WalterWalterDe Raedt2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1682Electro-optical characterization of modulation-doped field-effect transistors with monolithically-integrated test fixturesJournal article