Fohn, CorinnaCorinnaFohnChery, EmmanuelEmmanuelCheryCroes, KristofKristofCroesStucchi, MicheleMicheleStucchiAfanasiev, ValeriValeriAfanasiev2024-08-062024-03-072024-08-0620240038-1101WOS:001171682400001https://imec-publications.be/handle/20.500.12860/43645Voltage ramp stress based lifetime-prediction model of advanced Al-doped HfO2 dielectric for 2.5D MIMCAPsJournal article10.1016/j.sse.2024.108864WOS:001171682400001RELIABILITY