Correlation between current-voltage measurements and the barrier height determined by XPS in Ge p-MOS capacitors

Fadida, SivanSivanFadidaPalumbo, FFPalumboNyns, LauraLauraNynsLin, DennisDennisLinVan Elshocht, SvenSvenVan ElshochtCaymax, MattyMattyCaymaxEizenberg, MosheMosheEizenberg2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22331Correlation between current-voltage measurements and the barrier height determined by XPS in Ge p-MOS capacitorsMeeting abstracthttp://www2.avs.org/symposium/avs60/pdfs/abstractbook.pdf