Correlation of single trapping and detrapping effects in drain and gate currents of nanoscaled nFETs and pFETs

Toledano Luque, MariaMariaToledano LuqueKaczer, BenBenKaczerSimoen, EddyEddySimoenDegraeve, RobinRobinDegraeveFranco, JacopoJacopoFrancoRoussel, PhilippePhilippeRousselGrasser, TiborTiborGrasserGroeseneken, GuidoGuidoGroeseneken2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/21620Correlation of single trapping and detrapping effects in drain and gate currents of nanoscaled nFETs and pFETsProceedings paper