Vandamme, EwoutEwoutVandammeSchreurs, DominiqueDominiqueSchreursNauwelaers, BartBartNauwelaersvan Dinther, CeesCeesvan DintherBadenes, GonçalGonçalBadenesDeferm, LudoLudoDeferm2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/3944Reliable extraction of RF figures-of-merit for MOSFETsProceedings paper