Quantifying internal optical losses for 21% n-Si rear junction cells

Duerinckx, FilipFilipDuerinckxAleman, MonicaMonicaAlemanChoulat, PatrickPatrickChoulatKuzma Filipek, IzabelaIzabelaKuzma FilipekCornagliotti, EmanueleEmanueleCornagliottiSzlufcik, JozefJozefSzlufcik2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23778Quantifying internal optical losses for 21% n-Si rear junction cellsProceedings paperhttp://www.eupvsec-proceedings.com/proceedings?paper=27978