Design, Fabrication and Evaluation of Diamond Tip Chips for Reverse Tip Sample Scanning Probe Microscope Applications

Gim, SugilSugilGimHantschel, ThomasThomasHantschelKim, Jin HyeokJin HyeokKim2024-09-092024-04-052024-09-0920241225-0562WOS:001180757400002https://imec-publications.be/handle/20.500.12860/43778Design, Fabrication and Evaluation of Diamond Tip Chips for Reverse Tip Sample Scanning Probe Microscope ApplicationsJournal article10.3740/MRSK.2024.34.2.105WOS:001180757400002