Franco, JacopoJacopoFrancoKaczer, BenBenKaczerRoussel, PhilippePhilippeRousselCho, Moon JuMoon JuChoGrasser, TiborTiborGrasserMitard, JeromeJeromeMitardArimura, HiroakiHiroakiArimuraWitters, LiesbethLiesbethWittersCott, DaireDaireCottWaldron, NiamhNiamhWaldronZhou, DaisyDaisyZhouVais, AbhitoshAbhitoshVaisLin, DennisDennisLinAlian, AliRezaAliRezaAlianPourghaderi, Mohammad AliMohammad AliPourghaderiMartens, KoenKoenMartensSioncke, SonjaSonjaSionckeCollaert, NadineNadineCollaertThean, AaronAaronTheanHeyns, MarcMarcHeynsGroeseneken, GuidoGuidoGroeseneken2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23831BTI reliability of high-mobility channel devices: SiGe, Ge and InGaAsProceedings paper