Drain Induced Barrier Widening and Reverse Short Channel Effects in Tunneling FETs: Investigation and Analysis

Ram, Mamidala KarthikMamidala KarthikRamTiwari, NehaNehaTiwariAbdi, DawitDawitAbdiSneh, SaurabhSaurabhSneh2021-12-072021-11-252021-12-072021-12-0720212169-3536WOS:000717767300001https://imec-publications.be/handle/20.500.12860/38468Drain Induced Barrier Widening and Reverse Short Channel Effects in Tunneling FETs: Investigation and AnalysisJournal article10.1109/ACCESS.2021.3125856WOS:000717767300001GATE CMOS TECHNOLOGYDUAL-METAL GATEFIELDVOLTAGE