Wang, HuiHuiWangBruynseraede, ChristopheChristopheBruynseraedeChiaradia, DavidDavidChiaradiaMaex, KarenKarenMaex2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9900The influence of a structurally induced current crowding on electromigrationJournal article