Design-for-Test for Intermittent Faults in STT-MRAMs

Yuan, SicongSicongYuanYaldagard, Mohammad AminMohammad AminYaldagardXun, HanzhiHanzhiXunFieback, MoritzMoritzFiebackMarinissen, Erik JanErik JanMarinissenKim, WoojinWoojinKimRao, SiddharthSiddharthRaoCouet, SebastienSebastienCouetTaouil, MottaqiallahMottaqiallahTaouilHamdioui, SaidSaidHamdioui2025-05-132024-08-232025-05-132024979-8-3503-4933-71530-1877WOS:001260970400039https://imec-publications.be/handle/20.500.12860/44359Design-for-Test for Intermittent Faults in STT-MRAMsProceedings paper10.1109/ETS61313.2024.10567702979-8-3503-4932-0WOS:001260970400039