Variation-aware physics-based electromigration modeling and experimental calibration for VLSI interconnects

Mohanachandran Nair, SarathSarathMohanachandran NairBishnoi, RajendraRajendraBishnoiB. Tahoori, MehdiMehdiB. TahooriZahedmanesh, HoumanHoumanZahedmaneshCroes, KristofKristofCroesGarello, KevinKevinGarelloCatthoor, FranckyFranckyCatthoor2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/33608Variation-aware physics-based electromigration modeling and experimental calibration for VLSI interconnectsProceedings paperhttps://ieeexplore.ieee.org/document/8720559