Higashi, YusukeYusukeHigashiRonchi, NicoloNicoloRonchiKaczer, BenBenKaczerBanerjee, KaustuvKaustuvBanerjeeMcMitchell, SeanSeanMcMitchellO'Sullivan, BarryBarryO'SullivanClima, SergiuSergiuClimaMinj, AlbertAlbertMinjCelano, UmbertoUmbertoCelanoDi Piazza, LucaLucaDi PiazzaSuzuki, MasamichiMasamichiSuzukiLinten, DimitriDimitriLintenVan Houdt, JanJanVan Houdt2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/33160Impact of charge trapping on imprint and its recovery in HfO2 based FeFETProceedings paper