Analysis of point defect distributions in AlGaN/GaN heterostructures via spectroscopic photo current-voltage measurements

Ozden, BurcuBurcuOzdenKhanal, Min PMin PKhanalYoun, SuhyeonSuhyeonYounMirkhani, VahidVahidMirkhaniYapabandara, KosalaKosalaYapabandaraPark, MinseoMinseoParkZhao, MingMingZhaoLiang, HuHuLiangKandaswamy, Prem KumarPrem KumarKandaswamySaripalli, YogaYogaSaripalli2021-10-232021-10-2320162162-8769https://imec-publications.be/handle/20.500.12860/27104Analysis of point defect distributions in AlGaN/GaN heterostructures via spectroscopic photo current-voltage measurementsJournal articlehttp://jss.ecsdl.org/content/5/4/P3206.full.pdf+html