Li, XiangdongXiangdongLiBakeroot, BenoitBenoitBakerootWu, ZhichengZhichengWuAmirifar, NooshinNooshinAmirifarYou, ShuzhenShuzhenYouPosthuma, NielsNielsPosthumaZhao, MingMingZhaoLiang, HuHuLiangGroeseneken, GuidoGuidoGroesenekenDecoutere, StefaanStefaanDecoutere2021-10-282021-10-2820200741-3106https://imec-publications.be/handle/20.500.12860/35471Observation of dynamic VTH of p-GaN gate HEMTs by fast sweeping characterizationJournal article10.1109/LED.2020.2972971