Gaubas, EugenijusEugenijusGaubasSimoen, EddyEddySimoenVanhellemont, JanJanVanhellemont2021-10-232021-10-2320162162-8769https://imec-publications.be/handle/20.500.12860/26642Carrier lifetime spectrocopy for defect characterization in semiconductor materials and devicesJournal articlehttp://jss.ecsdl.org/content/5/4/P3108.short