Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies

Badaroglu, MustafaMustafaBadarogluDonnay, StephaneStephaneDonnayDe Man, HugoHugoDe ManZinzius, YannYannZinziusGielen, GeorgesGeorgesGielenSansen, WillyWillySansenFonden, TonyTonyFondenSignell, SvanteSvanteSignell2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7163Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple suppliesJournal article