Applicability of non-linear modelling methods based on vectorial large-signal measurements to MOSFETs

Schreurs, DominiqueDominiqueSchreursVandamme, EwoutEwoutVandammeVandenberghe, S.S.VandenbergheCarchon, GeertGeertCarchonNauwelaers, BartBartNauwelaers2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4733Applicability of non-linear modelling methods based on vectorial large-signal measurements to MOSFETsProceedings paper