Origin of the current discretization in deep reset states of an Al2O3/Cu-based conductive-bridging memory, and impact on state level and variability

Belmonte, AttilioAttilioBelmonteDegraeve, RobinRobinDegraeveFantini, AndreaAndreaFantiniKim, WWKimHoussa, MichelMichelHoussaJurczak, GosiaGosiaJurczakGoux, LudovicLudovicGoux2021-10-222021-10-2220140003-6951https://imec-publications.be/handle/20.500.12860/23533Origin of the current discretization in deep reset states of an Al2O3/Cu-based conductive-bridging memory, and impact on state level and variabilityJournal articlehttp://dx.doi.org/10.1063/1.4883856