Makarov, AlexanderAlexanderMakarovTyaginov, StanislavStanislavTyaginovKaczer, BenBenKaczerJech, MarkusMarkusJechVaisman Chasin, AdrianAdrianVaisman ChasinGrill, AlexanderAlexanderGrillHellings, GeertGeertHellingsVexler, MikhailMikhailVexlerLinten, DimitriDimitriLintenGrasser, TiborTiborGrasser2021-10-252021-10-252018-101063-7826https://imec-publications.be/handle/20.500.12860/31262Analysis of the features of hot-carrier degradation in FinFETsJournal articlehttps://doi.org/10.1134/S1063782618100081