Croon, JeroenJeroenCroonDecoutere, StefaanStefaanDecoutereSansen, WillyWillySansenMaes, HermanHermanMaes2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/8737Physical modeling and prediction of the matching properties of MOSFETsProceedings paper