A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability

Cao, XugangXugangCaoJiao, HailongHailongJiaoMarinissen, Erik JanErik JanMarinissen2022-03-092022-03-0920221549-7747WOS:000748372000063https://imec-publications.be/handle/20.500.12860/39399A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention CapabilityJournal article10.1109/TCSII.2021.3096885WOS:000748372000063