Vanstreels, KrisKrisVanstreelsWu, ChenChenWuGonzalez, MarioMarioGonzalezSchneider, DieterDieterSchneiderGidley, DavidDavidGidleyVerdonck, PatrickPatrickVerdonckBaklanov, MikhaïlMikhaïlBaklanov2021-10-212021-10-2120130743-7463https://imec-publications.be/handle/20.500.12860/23308Effect of pore structure of nanometer scale porous films on the measured elastic modulusJournal articlehttp://pubs.acs.org/doi/abs/10.1021/la402383g?prevSearch=vanstreels&searchHistoryKey=