Houssa, MichelMichelHoussaDe Jaeger, BriceBriceDe JaegerDelabie, AnneliesAnneliesDelabieVan Elshocht, SvenSvenVan ElshochtAfanasiev, ValeriValeriAfanasievAutran, J.L.J.L.AutranStesmans, AndreAndreStesmansMeuris, MarcMarcMeurisHeyns, MarcMarcHeyns2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10615Electrical characteristics of Ge/GeOx(N)/HfO2 gate stacksJournal article