On the microscopic origin of the frequency dependence of hole trapping in pMOSFETs

Grasser, TiborTiborGrasserReisinger, HansHansReisingerRott, KarinaKarinaRottToledano Luque, MariaMariaToledano LuqueKaczer, BenBenKaczer2021-10-202021-10-202012-12https://imec-publications.be/handle/20.500.12860/20751On the microscopic origin of the frequency dependence of hole trapping in pMOSFETsProceedings paper