Calibration of bulk trap-assisted tunneling and Shockley-Read-Hall currents and impact on InGaAs tunnel-FETs

Smets, QuentinQuentinSmetsVerhulst, AnneAnneVerhulstSimoen, EddyEddySimoenGundlach, DavidDavidGundlachRichter, CurtCurtRichterCollaert, NadineNadineCollaertHeyns, MarcMarcHeyns2021-10-242021-10-2420170018-9383https://imec-publications.be/handle/20.500.12860/29464Calibration of bulk trap-assisted tunneling and Shockley-Read-Hall currents and impact on InGaAs tunnel-FETsJournal articlehttp://ieeexplore.ieee.org/document/7984841/