Ahmed, RizwanRizwanAhmedKadashchuk, AndriyAndriyKadashchukSimbrunner, ClemensClemensSimbrunnerSchwabegger, GüntherGüntherSchwabeggerBaig, MuhammadMuhammadBaigSitter, HelmutHelmutSitter2021-10-222021-10-2220141944-8244https://imec-publications.be/handle/20.500.12860/23481Geometrical structure and interface dependence of bias dtress induced threshold voltage shift in C60-based OFETsJournal articlehttp://pubs.acs.org/doi/abs/10.1021/am5032192