Complete extraction of defect bands responsible for instabilities in n and pFinFETs

Rzepa, GerhardGerhardRzepaWaltl, MichaelMichaelWaltlGoes, WolfgangWolfgangGoesKaczer, BenBenKaczerFranco, JacopoJacopoFrancoChiarella, ThomasThomasChiarellaHoriguchi, NaotoNaotoHoriguchiGrasser, TiborTiborGrasser2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/27252Complete extraction of defect bands responsible for instabilities in n and pFinFETsProceedings paperpFinFETs http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=7573437