Yoshida, ShinichiShinichiYoshidaLin, DennisDennisLinSuzuki, RenaRenaSuzukiMiyanami, YukiYukiMiyanamiCollaert, NadineNadineCollaertHosoi, TakujiTakujiHosoiShimura, TakayoshiTakayoshiShimuraWatanabe, HeijiHeijiWatanabe2021-10-282021-10-2820190021-4922https://imec-publications.be/handle/20.500.12860/34492Analysis of III-V oxides at high-k / InGaAs interfaces induced by metal electrodesJournal articlehttps://doi.org/10.7567/1347-4065/ab0256