Janssens, OlivierOlivierJanssensVandewalle, RikRikVandewalleLoccufier, MiaMiaLoccufierVan Hoecke, SofieSofieVan Hoecke2021-10-252021-10-252018-021083-4435https://imec-publications.be/handle/20.500.12860/30963Deep learning for infrared thermal image based machine health monitoringJournal articlehttp://ieeexplore.ieee.org/document/7967622/