Hsu, BrentBrentHsuSimoen, EddyEddySimoenLin, DennisDennisLinStesmans, AndreAndreStesmansGoux, LudovicLudovicGouxDelhougne, RomainRomainDelhougneCarolan, PatrickPatrickCarolanBender, HugoHugoBenderKar, Gouri SankarGouri SankarKar2021-10-282021-10-2820202162-8769https://imec-publications.be/handle/20.500.12860/35288A deep level transient spectroscopy study of hole traps in GexSe1-x-based layers for ovonic threshold switching selectorsJournal articlehttps://doi.org/10.1149/2162-8777/ab8b70