Chen, Shih-HungShih-HungChenKarp, JamesJamesKarpSimicic, MarkoMarkoSimicicTsiara, ArtemisiaArtemisiaTsiaraTsaggaris, DeanDeanTsaggarisCroes, KristofKristofCroesBan, YoojinYoojinBanTan, PhoumraPhoumraTanDe Heyn, PeterPeterDe HeynChang, JonathanJonathanChangHart, Michael J.Michael J.HartWu, XinXinWuLinten, DimitriDimitriLintenVan Campenhout, JorisJorisVan Campenhout2022-08-262022-05-052022-08-182022-08-262021-10-27978-1-58537-330-70739-5159WOS:000786179000022https://imec-publications.be/handle/20.500.12860/39745HBM and CDM ESD Performance of Advanced Silicon Photonic ComponentsProceedings paper10.23919/EOS/ESD52038.2021.9574767978-1-58537-329-1WOS:000786179000022Electrical & electronic engineeringelectrostatic dischargeSilicon photonicsRobustnessPhotodetectorsgermaniumfailure analysis