Statistical model of the NBTI-induced threshold voltage, subthreshold swing, and transconductance degradations in advanced p-FinFETs

Franco, JacopoJacopoFrancoKaczer, BenBenKaczerMukhopadhyay, SubhadeepSubhadeepMukhopadhyayDuhan, PardeepPardeepDuhanWeckx, PieterPieterWeckxRoussel, PhilippePhilippeRousselChiarella, ThomasThomasChiarellaRagnarsson, Lars-AkeLars-AkeRagnarssonTrojman, LionelLionelTrojmanHoriguchi, NaotoNaotoHoriguchiSpessot, AlessioAlessioSpessotLinten, DimitriDimitriLintenMocuta, AndaAndaMocuta2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/26629Statistical model of the NBTI-induced threshold voltage, subthreshold swing, and transconductance degradations in advanced p-FinFETsProceedings paper