Excess carrier cross-sectional profiling technique for determination of the surface recombination velocity

Gaubas, EugenijusEugenijusGaubasSimoen, EddyEddySimoenClaeys, C.C.ClaeysVanhellemont, JanJanVanhellemont2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4384Excess carrier cross-sectional profiling technique for determination of the surface recombination velocityOral presentation