Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability

Afanas'ev, V.V.Afanas'evRavsher, TarasTarasRavsherHoushmand Sharifi, ShaminShaminHoushmand SharifiFantini, AndreaAndreaFantiniHody, HubertHubertHodyWitters, ThomasThomasWittersGarbin, DanieleDanieleGarbinDegraeve, RobinRobinDegraeveVan Houdt, JanJanVan HoudtGoux, LudovicLudovicGouxCrotti, DavideDavideCrottiKar, Gouri SankarGouri SankarKar2022-03-172022-03-1720212330-7978WOS:000681328500029https://imec-publications.be/handle/20.500.12860/39496Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliabilityProceedings paper10.1109/IMW51353.2021.9439629978-1-7281-8517-0WOS:000681328500029