Model for the current-voltage characteristics of ultrathin gate oxides after soft breakdown

Houssa, MichelMichelHoussaNigam, TanyaTanyaNigamMertens, PaulPaulMertensHeyns, MarcMarcHeyns2021-09-302021-09-301998https://imec-publications.be/handle/20.500.12860/2641Model for the current-voltage characteristics of ultrathin gate oxides after soft breakdownJournal article