On the Correlation Between Static and Low-Frequency Noise Parameters of Vertical Nanowire nMOSFETs

Simoen, EddyEddySimoenVaisman Chasin, AdrianAdrianVaisman ChasinMatagne, PhilippePhilippeMatagneRosseel, ErikErikRosseelHikavyy, AndriyAndriyHikavyyLoo, RogerRogerLooFavia, PaolaPaolaFaviaBender, HugoHugoBenderVancoille, EricEricVancoilleHoriguchi, NaotoNaotoHoriguchiVeloso, AnabelaAnabelaVeloso2021-10-292021-10-292020-05https://imec-publications.be/handle/20.500.12860/35950On the Correlation Between Static and Low-Frequency Noise Parameters of Vertical Nanowire nMOSFETsMeeting abstracthttps://ecs.confex.com/ecs/237/meetingapp.cgi/Paper/130820