Rzepa, G.G.RzepaGoes, W.W.GoesRott, G.G.RottRott, K.K.RottKarner, M.M.KarnerKernstock, C.C.KernstockKaczer, BenBenKaczerReisinger, H.H.ReisingerGrasser, T.T.Grasser2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/24472Physical modeling of NBTI: from individual defects to devicesProceedings paperhttp://dx.doi.org/10.1109/SISPAD.2014.6931568