Browsing by author "Chang, Hao"
Now showing items 1-3 of 3
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Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs
Chang, Hao; Zhou, Longda; Yang, Hong; Ji, Zhigang; Liu, Qianqian; Simoen, Eddy; Yin, Huaxiang; Wang, Wenwu (2021) -
Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs
Chang, Hao; Zhang, Yongkui; Zhou, Longda; Ji, Zhigang; Yang, Hong; Liu, Qianqian; Li, Yongliang; Liang, Renrong; Simoen, Eddy; Zhu, Huilong; Luo, Jun; Wang, Wenwu (2021) -
Degradation Mechanism of Short Channel p-FinFETs under Hot Carrier Stress and Constant Voltage Stress
Chang, Hao; Zhou, Longda; Yang, Hong; Ji, Zhigang; Liu, Qianqian; Xu, Hao; Simoen, Eddy; Yin, Huaxiang; Wang, Wenwu (2020)