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Publication Impact of Redundancy and Line Extension on Short-Length Effect in Electromigration Reliability
Proceedings paper2025, IEEE International Interconnect Technology Conference (IITC), 2025-06-02Publication Thermally-Induced Morphology Changes in Subtractive Ru Lines and Their Mitigation
Proceedings paper2025, IEEE International Interconnect Technology Conference (IITC), 2025-06-02Publication Via resistance optimization at advanced sub-2nm nodes
Proceedings paper2025, IEEE International Interconnect Technology Conference (IITC), 2025-06-02Publication Algorithm for robust correction of long-term drift components in gate leakage current RTN data
Proceedings paper2025, IEEE International Reliability Physics Symposium (IRPS), 2025-03-30