Browsing by author "Verheyden, P."
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XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers
Conard, Thierry; De Witte, Hilde; Loo, Roger; Verheyden, P.; Vandervorst, Wilfried; Caymax, Matty; Gijbels, Renaat (1999)
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