Browsing by author "Inoue, Koji"
Now showing items 1-2 of 2
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Atom-probe-tomographic studies on silicon-based semiconductor devices
Inoue, Koji; Kambham, Ajay Kumar; Mangelinck, Dominique; Lawrence, Dan; Kelly, Thomas F. (2012) -
Industrial application of atom probe tomography to semiconductor devices
Giddings, Alexander Devin; Koelling, Sebastian; Shimizu, Shimizu; Estivill, Robert; Inoue, Koji; Vandervorst, Wilfried; Yeoh, Wai Kong (2018)