Browsing by imec author "40a3fc1ae934a190e34ba888e6dfea1ea3633994"
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Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations
Nazir, Aftab; Eyben, Pierre; Clarysse, Trudo; Hellings, Geert; Schulze, Andreas; Mody, Jay; De Meyer, Kristin; Bender, Hugo; Vandervorst, Wilfried (2012)