Browsing by author "Torres Jacome, Alfonso"
Now showing items 1-2 of 2
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Characterization of ultra-thin PtSi films for infrared detectors
Bender, Hugo; Roussel, Philippe; Kolodinski, Sabine; Torres Jacome, Alfonso; Alves Donaton, Ricardo; Maex, Karen; van der Sluis, P. (1996) -
New process for controlled formation of ultra-thin PtSi films for infra-red detector applications
Torres Jacome, Alfonso; Kolodinski, Sabine; Alves Donaton, Ricardo; Maex, Karen; Roussel, Philippe; Bender, Hugo (1995)